光源類型

Light type

氙燈瞬態(tài)光源

Xenon lamp

光譜范圍

Spectrum wavelength

300-1200nm

300-1200nm

光源等級

Classfication of light source

光譜匹配度  0.875-1.125 A+

輻照度不均勻度  ≤1% A+

輻照度不穩(wěn)定度  ≤1% A+

Spectral match is 0.875-1.125, class   A+

Irradiance non-uniformity is ≤1%,  class   A+

Irradiance instability is ≤1%,  class   A+

輻照度范圍

Irradiance intensity

200W/㎡~1200W/㎡

200W/㎡~1200W/㎡

測試面積

Illumination area

? 2600*1600mm

? 可定制其他尺寸

? 2600mm*1600mm,

? Other size can be customized

脈沖寬度

Pulse duration

10-100ms，每1ms步進可調(diào)

10-100ms, in step of 1ms

重復(fù)性精度

Repeatability

≤0.1%

≤0.1%

測試技術(shù)

Testing technology

標配線性掃描、高級遲滯算法、集成逐次逼近法（SAT）、智能測試法（IAT）、峰值保持測試功能

It is equipped with linear scanning,  advanced magnetic hysteresis, successive approximation testing technology(SAT),  Intelligent testing technology(IAT) and peak holding test function.

測試電池

Measurable cell type

Perc、 Topcon、BC、異質(zhì)結(jié)等高容性電池組件

PERC, TopCon, BC, HJT and other high capacitance solar modules.

可增配項

Optional service

? EL測試系統(tǒng)，實現(xiàn)同工位IV/EL測試

? 溫控系統(tǒng)，實現(xiàn)Panfile、溫度系數(shù)測試

? WPVS電池，實現(xiàn)絕對測量

? IAM旋轉(zhuǎn)支架，實現(xiàn)不同角度測量

? 低輻照度濾鏡，實現(xiàn)低輻照度測試

? 多通道溫度盒，實現(xiàn)多點溫度測量

? EL testing system, to achieve IV testing

and EL testing at a same section.

? Temperature chamber, to achieve

Panfile testing and measurement of

temperature coefficient.

? WPVS battery, to achieve absolute

measurement.

? IAM Rotating bracket, to achieve

measurement from diffierent angles.

? Equip with optical filter for low

irradiance test

? Multi-channel temperature sensor  for

temperature measurement of multi-points.